Invention Grant
- Patent Title: Real-time measurement of a surface charge profile of an electrostatic chuck
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Application No.: US14924954Application Date: 2015-10-28
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Publication No.: US10656194B2Publication Date: 2020-05-19
- Inventor: Haitao Wang , Lawrence Wong , Kartik Ramaswamy , Chunlei Zhang
- Applicant: APPLIED MATERIALS, INC.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Moser Taboada
- Agent Alan Taboada
- Main IPC: G01R29/24
- IPC: G01R29/24 ; H01L21/683 ; H01L21/67

Abstract:
Methods and apparatus for measurement of a surface charge profile of an electrostatic chuck are provided herein. In some embodiments, an apparatus for measurement of a surface charge profile of an electrostatic chuck includes: an electrostatic charge sensor disposed on a substrate to obtain data indicative of an electrostatic charge on an electrostatic chuck; and a transmitter disposed on the substrate and having an input in communication with an output of the electrostatic charge sensor to transmit the data.
Public/Granted literature
- US20160116518A1 REAL-TIME MEASUREMENT OF A SURFACE CHARGE PROFILE OF AN ELECTROSTATIC CHUCK Public/Granted day:2016-04-28
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