Invention Grant
- Patent Title: Event analysis device, event analysis system, event analysis method, and event analysis program
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Application No.: US15330778Application Date: 2016-11-07
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Publication No.: US10664374B2Publication Date: 2020-05-26
- Inventor: Zhuo Liu , Yuichi Sakuraba
- Applicant: YOKOGAWA ELECTRIC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Yokogawa Electric Corporation
- Current Assignee: Yokogawa Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2a347e13
- Main IPC: G06F17/30
- IPC: G06F17/30 ; G06F7/00 ; G06F11/30 ; G06F16/22 ; G06F16/28 ; G05B23/02 ; G06F11/32 ; G06F11/34 ; G05B19/042 ; G05B15/02

Abstract:
An event analysis device having an event collector for collecting event log data representing an operation history by a DCS operator; an event analyzer for analyzing the event log data, and extracting basic unit operations or unit operations representing an operation method based on operations of the DCS operator or an operation intention based on operations of the DCS operator; an operation sequence extractor for extracting operation sequences which the basic unit operations or the unit operations are aligned in accordance with time order in every service time period; an operation clusterer for clustering the operation sequences based on similarity among the operation sequences extracted in every service time period; and an operation procedure generator for analyzing the operation sequences clustered in same type, and estimating a structure of the operation procedure based on the operation of the DCS operator.
Public/Granted literature
- US20170132104A1 Event analysis device, event analysis system, event analysis method, and event analysis program Public/Granted day:2017-05-11
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