Invention Grant
- Patent Title: Innovative high speed serial controller testing
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Application No.: US15199323Application Date: 2016-06-30
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Publication No.: US10664433B2Publication Date: 2020-05-26
- Inventor: Lakshminarayana Pappu , Timothy J. Callahan , Hem Doshi , Hooi Kar Loo , Suketu U. Bhatt
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt P.C.
- Main IPC: G06F13/42
- IPC: G06F13/42 ; H04L29/06 ; G06F21/82

Abstract:
In accordance with disclosed embodiments, there are provided systems, methods, and apparatuses for implementing SoC coverage through virtual devices in PCIe and DMI controllers. According to one embodiment there is a functional semiconductor device, having therein a serial Input/Output interface (serial IO interface); a device fabric to carry transactions between a plurality of components of the functional semiconductor device; virtualized device logic embedded within the serial IO interface; a transaction originator to originate a shuttle transaction and to issue the shuttle transaction onto the device fabric directed toward the serial IO interface; in which the shuttle transaction includes a shuttle header and a shuttle payload having embedded therein one or more passenger transactions for issuance onto the device fabric; in which the virtualized device logic is to receive the shuttle transaction at the serial IO interface via the device fabric; in which the virtualized device logic is to strip the shuttle header from the shuttle transaction to expose the one or more passenger transactions; and in which the virtualized device logic is to issue the one or more passenger transactions onto the device fabric. Other related embodiments are disclosed.
Public/Granted literature
- US20180004702A1 INNOVATIVE HIGH SPEED SERIAL CONTROLLER TESTING Public/Granted day:2018-01-04
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