Invention Grant
- Patent Title: Raman spectrum inspection apparatus
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Application No.: US16043900Application Date: 2018-07-24
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Publication No.: US10670457B2Publication Date: 2020-06-02
- Inventor: Jianhong Zhang , Hongqiu Wang , Li Zhang
- Applicant: NUCTECH COMPANY LIMITED
- Applicant Address: CN Haidian District, Beijing
- Assignee: NUCTECH COMPANY LIMITED
- Current Assignee: NUCTECH COMPANY LIMITED
- Current Assignee Address: CN Haidian District, Beijing
- Agency: Merchant & Gould P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@158d6dfb
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01J3/02 ; G01N21/65 ; G01J3/10

Abstract:
A Raman spectrum inspection apparatus is provided, including: a exciting light source configured to emit an exciting light to a sample to be inspected; an optical device configured to collect an optical signal from a position, which is irradiated by the exciting light, of the sample to be inspected; and a spectrometer configured to generate a Raman spectrum of the sample to be inspected from the received optical signal, wherein an excitation optical path in which the exciting light passes from the exciting light device to the sample to be inspected and a detection optical path in which the optical signal received by the spectrometer passes from the sample to be inspected to the spectrometer are separated from each other.
Public/Granted literature
- US20190033128A1 RAMAN SPECTRUM INSPECTION APPARATUS Public/Granted day:2019-01-31
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