Invention Grant
- Patent Title: Analyzer sample detection method and system
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Application No.: US15982373Application Date: 2018-05-17
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Publication No.: US10697895B2Publication Date: 2020-06-30
- Inventor: David R. Day
- Applicant: SciAps, Inc.
- Applicant Address: US MA Woburn
- Assignee: SciAps, Inc.
- Current Assignee: SciAps, Inc.
- Current Assignee Address: US MA Woburn
- Agency: Iandiorio Teska & Coleman, LLP
- Main IPC: G01J3/443
- IPC: G01J3/443 ; G01N21/71 ; G01J3/02

Abstract:
A spectrometer system and method including a laser source for directing a laser beam to a sample producing plasma radiation on the sample. At least one fiber of a fiber bundle is connected to an illumination source for directing light to the sample. A spectrometer subsystem receives plasma radiation from the sample via the detection fiber bundle and receives light from the illumination source reflected off the sample also via the detection fiber bundle for detecting the presence of the sample.
Public/Granted literature
- US20180266962A1 ANALYZER SAMPLE DETECTION METHOD AND SYSTEM Public/Granted day:2018-09-20
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