A method for testing and grading electronic devices includes receiving a set of testing data associated with an electronic device that is following a testing routine. Based on the set of testing data, the method includes computing a first performance metric of the electronic device by using a first artificial neural network and computing a second performance metric of the electronic device by using a second artificial neural network. Based on at least the first predicted performance metric and the second predicted performance metric, the method includes computing a grade for the electronic device.