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    Methods, devices, and systems for reducing device test time
    1.
    发明授权
    Methods, devices, and systems for reducing device test time 有权

    公开(公告)号：US10699193B2

    公开(公告)日：2020-06-30

    申请号：US15833135

    申请日：2017-12-06

    Applicant: Seagate Technology LLC

    Inventor： ChengYi Guo ,  Teck Khoon Lim ,  Teck Hoon Chua

    IPC: G06F11/00 ,  G06N3/08 ,  G11B27/36 ,  G11B5/455 ,  G11B5/31 ,  G11B5/09

    Abstract: A method for testing and grading electronic devices includes receiving a set of testing data associated with an electronic device that is following a testing routine. Based on the set of testing data, the method includes computing a first performance metric of the electronic device by using a first artificial neural network and computing a second performance metric of the electronic device by using a second artificial neural network. Based on at least the first predicted performance metric and the second predicted performance metric, the method includes computing a grade for the electronic device.

    Methods and devices for reducing device test time
    2.
    发明授权
    Methods and devices for reducing device test time 有权

    公开(公告)号：US10339448B2

    公开(公告)日：2019-07-02

    申请号：US15401409

    申请日：2017-01-09

    Applicant: Seagate Technology LLC

    Inventor： ChengYi Guo ,  TeckKhoon Lim ,  TeckHoon Chua

    IPC: G11B19/04 ,  G06N3/08 ,  G01R33/12 ,  G06F11/00 ,  G06N3/04

    Abstract: A method includes receiving a first set of testing data associated with a first group of electronic devices. The first set of testing data is generated during a tuning test applying a first range of testing parameters. The method further includes receiving a second set of testing data associated with the first group of electronic devices. Further, the method includes determining, based on the first set of testing data and the second set of testing data, a second range of testing parameters that is less than the first range of testing parameters. The method includes testing a second group of electronic devices using a tuning test applying the second range of testing parameters.

    Adaptive cleaning of a media surface responsive to a mechanical disturbance event
    4.
    发明授权
    Adaptive cleaning of a media surface responsive to a mechanical disturbance event 有权

    公开(公告)号：US10199067B1

    公开(公告)日：2019-02-05

    申请号：US15934243

    申请日：2018-03-23

    Applicant: Seagate Technology LLC

    Inventor： Swee Chuan Samuel Gan ,  Lihong Zhang ,  Xiong Liu ,  ChengYi Guo

    IPC: G11B5/09 ,  G11B23/50 ,  G11B20/18 ,  G11B23/02 ,  G11B5/012

    Abstract: Apparatus and method for proactively cleaning a data storage surface subjected to a mechanical disturbance. In some embodiments, data access commands are serviced by a data storage device to transfer user data between a host device and a rotatable data recording surface using a radially moveable data transducer. A media cleaning operation is scheduled and performed in response to the detection of a mechanical disturbance event externally applied to the data storage device. The media cleaning operation involves sweeping the data transducer across the data recording surface from a first radius to a second radius over a selected time duration. The entirety of the data recording surface is swept if sufficient time is available between pending commands to maintain a desired host data transfer rate. Otherwise, a partial cleaning operation is scheduled in which portions of the recording surface are successively cleaned between the servicing of the pending commands.

    METHODS AND DEVICES FOR REDUCING DEVICE TEST TIME
    5.
    发明申请
    METHODS AND DEVICES FOR REDUCING DEVICE TEST TIME 审中-公开

    公开(公告)号：US20180197574A1

    公开(公告)日：2018-07-12

    申请号：US15401409

    申请日：2017-01-09

    Applicant: Seagate Technology LLC

    Inventor： ChengYi Guo ,  TeckKhoon Lim ,  TeckHoon Chua

    IPC: G11B20/18 ,  G06N3/08

    CPC classification number: G06N3/08 ,  G01R33/1207 ,  G06F11/00 ,  G06N3/0445 ,  G11B19/048

    Abstract: A method includes receiving a first set of testing data associated with a first group of electronic devices. The first set of testing data is generated during a tuning test applying a first range of testing parameters. The method further includes receiving a second set of testing data associated with the first group of electronic devices. Further, the method includes determining, based on the first set of testing data and the second set of testing data, a second range of testing parameters that is less than the first range of testing parameters. The method includes testing a second group of electronic devices using a tuning test applying the second range of testing parameters.

    METHODS, DEVICES, AND SYSTEMS FOR REDUCING DEVICE TEST TIME
    7.
    发明申请
    METHODS, DEVICES, AND SYSTEMS FOR REDUCING DEVICE TEST TIME 审中-公开

    公开(公告)号：US20190171940A1

    公开(公告)日：2019-06-06

    申请号：US15833135

    申请日：2017-12-06

    Applicant: Seagate Technology LLC

    Inventor： ChengYi Guo ,  Teck Khoon Lim ,  Teck Hoon Chua

    IPC: G06N3/08 ,  G06F11/00 ,  G11B27/36

    Abstract: A method for testing and grading electronic devices includes receiving a set of testing data associated with an electronic device that is following a testing routine. Based on the set of testing data, the method includes computing a first performance metric of the electronic device by using a first artificial neural network and computing a second performance metric of the electronic device by using a second artificial neural network. Based on at least the first predicted performance metric and the second predicted performance metric, the method includes computing a grade for the electronic device.

    MR-offset change detection and compensation
    10.
    发明授权
    MR-offset change detection and compensation 有权
    MR偏移变化检测和补偿

    公开(公告)号：US09159369B1

    公开(公告)日：2015-10-13

    申请号：US14640852

    申请日：2015-03-06

    Applicant: Seagate Technology LLC

    Inventor： Xiong Liu ,  ChengYi Guo ,  Jui Jing Lim ,  HtayNwe Aung

    IPC: G11B27/36 ,  G11B5/455 ,  G11B20/18 ,  G11B5/596 ,  G11B5/55

    CPC classification number: G11B27/36 ,  G11B5/455 ,  G11B5/5565 ,  G11B5/59627 ,  G11B5/59672 ,  G11B5/59694 ,  G11B20/182

    Abstract: A method, computer-readable medium, and storage device for detecting and compensating for a change in MR-offset in a disk-based storage device. A pattern is written to a track on a disk of the storage device utilizing a read/write head. The read channel of the storage device is then configured as a harmonic sensor and the pattern is read from the track at a specific off-track position of the read/write head. The magnitude of the harmonic sensor is measured during the read, and the change in MR-offset is calculated for the read/write head based on the measured magnitude value and a predetermined transfer function between off-track amount and harmonic sensor magnitude. The change in MR-offset may then be utilized by a servo mechanism of the storage device to correct head positioning during a write operation for the read/write head.

    Abstract translation: 一种用于检测和补偿基于磁盘的存储设备中MR偏移的变化的方法，计算机可读介质和存储设备。 使用读/写头将模式写入存储设备的盘上的轨道。 然后将存储装置的读取通道配置为谐波传感器，并且在读/写头的特定离轨位置从轨道读取图案。 在读取期间测量谐波传感器的幅度，并且基于所测量的幅度值和偏移量与谐波传感器幅度之间的预定传递函数，针对读/写头计算MR偏移的变化。 然后可以由存储装置的伺服机构利用MR偏移的改变来在读/写头的写入操作期间校正头定位。

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