Invention Grant
- Patent Title: Sample carrier and electron microscope
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Application No.: US16531697Application Date: 2019-08-05
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Publication No.: US10699870B2Publication Date: 2020-06-30
- Inventor: Shuho Yoshida
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2e500c20
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/18 ; H01J37/26

Abstract:
A sample carrier capable of preventing damage to a support stage on which a sample holder is placed while ensuring a sufficient level of conveyance speed includes a sample holder, a holder mounting member, and a transport portion. The transport portion has a drive source (constant-speed motor), a rotary member (second toothed wheel), a guide portion (linear guide), and a rod. The rotary member is rotated about its axis of rotation by the drive source. The guide portion operates to guide the holder mounting member in a linear direction perpendicular to the axis of rotation of the rotary member. The rod is rotatably coupled to the rotary member and to the holder mounting member and has a coupled portion coupled to the rotary member. At a midpoint of the range of movement of the holder mounting member, the shortest distance from the coupled portion to the guide portion is greatest.
Public/Granted literature
- US20200051775A1 Sample Carrier and Electron Microscope Public/Granted day:2020-02-13
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