Invention Grant
- Patent Title: Vacuum condition controlling apparatus, system and method for specimen observation
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Application No.: US15741240Application Date: 2017-03-02
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Publication No.: US10699874B2Publication Date: 2020-06-30
- Inventor: Wei He , Shuai Li
- Applicant: Focus-eBeam Technology (Beijing) Co., Ltd.
- Applicant Address: CN Beijing
- Assignee: Focus-eBeam Technology (Beijing) Co., Ltd.
- Current Assignee: Focus-eBeam Technology (Beijing) Co., Ltd.
- Current Assignee Address: CN Beijing
- Agency: Syncoda LLC
- Agent Feng Ma
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1388f34c
- International Application: PCT/CN2017/075465 WO 20170302
- International Announcement: WO2018/094903 WO 20180531
- Main IPC: H01J37/28
- IPC: H01J37/28 ; H01J37/26 ; G01N23/2251

Abstract:
A vacuum condition controlling apparatus, the top of which is connected with an electron beam generating instrument. The apparatus is rotationally symmetric, comprises the following parts deployed outward from the central axis: the central channel, the first pumping channel, the gas supplying chamber and the at least one pumping chamber. A pressure limiting aperture is deployed near the outlet of the central channel, for keeping the pressure difference between the central channel and the outside environment, and allow the electron beam to go through the central channel; the first pumping channel is connected to the central channel to pump the central channel; the top of the gas supplying chamber is connected to the gas supplying channel to supply gas to the area between the specimen and the apparatus; the top of the second pumping channel is connected to the second pumping channel, to pump the area.
Public/Granted literature
- US20200035448A1 VACUUM CONDITION CONTROLLING APPARATUS, SYSTEM AND METHOD FOR SPECIMEN OBSERVATION Public/Granted day:2020-01-30
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