Invention Grant
- Patent Title: Time-of-flight mass spectrometer
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Application No.: US15512156Application Date: 2014-09-18
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Publication No.: US10699892B2Publication Date: 2020-06-30
- Inventor: Daisuke Okumura
- Applicant: Shimadzu Corporation
- Applicant Address: JP Kyoto-shi, Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto-shi, Kyoto
- Agency: Sughrue Mion, PLLC
- International Application: PCT/JP2014/074625 WO 20140918
- International Announcement: WO2016/042632 WO 20160324
- Main IPC: H01J49/40
- IPC: H01J49/40 ; H01J49/06

Abstract:
A voltage applied to an exit gate electrode forming a potential barrier and temporarily trapping ions within the inner space of the ion guide is higher than a voltage at an ion guide's exit end. A higher voltage is applied to the exit gate electrode for a lower m/z value of the measurement target ion, to push back the ion which has slowly moved along a potential gradient and reached the exit end of the ion guide. An ion having a lower m/z value is more likely to be located in a farther region from the exit end and forced to travel a longer distance when voltage applied to the exit gate electrode is lowered. A lower m/z value also means a higher travelling speed toward the orthogonal accelerator, whereby m/z dependency of the time required for travel from the ion guide to the orthogonal accelerator eventually becomes low.
Public/Granted literature
- US20170278691A1 TIME-OF-FLIGHT MASS SPECTROMETER Public/Granted day:2017-09-28
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