Invention Grant
- Patent Title: Item inspecting device
-
Application No.: US15741027Application Date: 2016-06-30
-
Publication No.: US10713775B2Publication Date: 2020-07-14
- Inventor: Young Heon Bae , Seung Jun Lee , Jeong Yeob Kim , Deok Hwa Hong , Moon Young Jeon , Joon Koo Kang , Joongki Jeong , Jae Yoon Jung , Jong Hui Lee
- Applicant: KOH YOUNG TECHNOLOGY INC.
- Applicant Address: KR Seoul
- Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee: KOH YOUNG TECHNOLOGY INC.
- Current Assignee Address: KR Seoul
- Agency: Kile Park Reed & Houtteman PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@449da510 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@72d0fac2
- International Application: PCT/KR2016/007081 WO 20160630
- International Announcement: WO2017/003241 WO 20170105
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G01B11/24 ; G01B11/25 ; G01N21/95 ; G01N21/88

Abstract:
An item inspection apparatus includes an image obtaining section and a control section. The image obtaining section obtains a captured image of at least a part of an item. The control section determines whether the item is defective by using the captured image of the item. The control section performs a first inspection for at least one of position, shape and size with respect to at least one of a first element and a second element. The first element has a predetermined shape and is formed on the item and the second element includes at least one of an opening, a depression and a through-hole formed in the item. The control section performs a second inspection for at least one of foreign substance adhesion, scratch and surface stain on the item. Thus, the defect inspection may be performed more precisely and effectively.
Public/Granted literature
- US20190035066A1 ITEM INSPECTING DEVICE Public/Granted day:2019-01-31
Information query