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公开(公告)号：US12135204B2
公开(公告)日：2024-11-05
申请号：US17623508
申请日：2020-06-29
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon Lee , Moon Young Jeon , Deok Hwa Hong , Joong Ki Jeong
Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus includes one or more first light sources configured to irradiate one or more first pattern lights to the object, a second light source configured to sequentially irradiate one or more second pattern lights having one phase range, a beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights, an image sensor configured to capture one or more first reflected lights and one or more second reflected lights, and a processor configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights.
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公开(公告)号：US11360031B2
公开(公告)日：2022-06-14
申请号：US17123901
申请日：2020-12-16
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon Lee , Moon Young Jeon , Jung Hur , Deok Hwa Hong , Eun Ha Jo
Abstract: The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US12146734B2
公开(公告)日：2024-11-19
申请号：US17623498
申请日：2020-06-29
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon Lee , Moon Young Jeon , Deok Hwa Hong , Joong Ki Jeong
Abstract: The present disclosure proposes a detachable second apparatus coupled to a first apparatus that determines a first three-dimensional shape of an object and configured to determine an angle of an upper surface of the object. The second apparatus includes a first light source configured to sequentially irradiate first pattern lights having one phase range, a beam splitter and lenses configured to change optical paths of the first pattern lights so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of the upper surface of the object, a communication interface, and a first processor configured to obtain first information on first reflected lights generated by reflecting the first pattern lights from the partial region and determine the angle of the upper surface with respect to the reference plane based on the first information.
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公开(公告)号：US12105029B2
公开(公告)日：2024-10-01
申请号：US18499784
申请日：2023-11-01
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon Lee , Moon Young Jeon , Jung Hur , Deok Hwa Hong , Eun Ha Jo
CPC classification number: G01N21/9501 , G01N21/4738
Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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Patent Agency Ranking
公开(公告)号：US11821846B2
公开(公告)日：2023-11-21
申请号：US17735521
申请日：2022-05-03
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon Lee , Moon Young Jeon , Jung Hur , Deok Hwa Hong , Eun Ha Jo
CPC classification number: G01N21/9501 , G01N21/4738
Abstract: An inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US10890538B2
公开(公告)日：2021-01-12
申请号：US16653291
申请日：2019-10-15
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Chan Kwon Lee , Moon Young Jeon , Jung Hur , Deok Hwa Hong , Eun Ha Jo
Abstract: The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US10788318B2
公开(公告)日：2020-09-29
申请号：US16369339
申请日：2019-03-29
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Moon Young Jeon
IPC: G01B11/25 , H04N13/239 , G01N21/956 , G01B11/245 , G01B11/02 , H04N13/243 , H04N13/254 , G06T7/521 , G06T7/593
Abstract: A three-dimensional shape measurement apparatus includes main pattern illumination parts, main image-capturing parts and a control part. The main pattern illumination parts obliquely illuminate grating pattern light in different directions toward a measurement target. The main image-capturing parts obtain a grating pattern image of the measurement target by receiving reflection light of the grating pattern light illuminated from the main pattern illumination parts and obliquely reflected by the measurement target. The control part produces height data of the measurement target using grating pattern images of the measurement target, or produces height data of the measurement target using image positions of plane images for the measurement target and texture information of the measurement target. The control part employs a grating pattern illuminated on the measurement target as the texture information to produce height data of the measurement target. Thus, a three-dimensional shape may be measured more easily and accurately.
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公开(公告)号：US10713775B2
公开(公告)日：2020-07-14
申请号：US15741027
申请日：2016-06-30
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Young Heon Bae , Seung Jun Lee , Jeong Yeob Kim , Deok Hwa Hong , Moon Young Jeon , Joon Koo Kang , Joongki Jeong , Jae Yoon Jung , Jong Hui Lee
Abstract: An item inspection apparatus includes an image obtaining section and a control section. The image obtaining section obtains a captured image of at least a part of an item. The control section determines whether the item is defective by using the captured image of the item. The control section performs a first inspection for at least one of position, shape and size with respect to at least one of a first element and a second element. The first element has a predetermined shape and is formed on the item and the second element includes at least one of an opening, a depression and a through-hole formed in the item. The control section performs a second inspection for at least one of foreign substance adhesion, scratch and surface stain on the item. Thus, the defect inspection may be performed more precisely and effectively.
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公开(公告)号：US10302423B2
公开(公告)日：2019-05-28
申请号：US15735021
申请日：2016-06-03
Applicant: KOH YOUNG TECHNOLOGY INC.
Inventor： Moon Young Jeon
IPC: G01B11/25 , G01B11/02 , G01B11/245 , G01N21/956 , G06T7/521 , G06T7/593 , H04N13/254 , H04N13/243 , H04N13/239
Abstract: A three-dimensional shape measurement apparatus includes main pattern illumination parts, main image-capturing parts and a control part. The main pattern illumination parts obliquely illuminate grating pattern light in different directions toward a measurement target. The main image-capturing parts obtain a grating pattern image of the measurement target by receiving reflection light of the grating pattern light illuminated from the main pattern illumination parts and obliquely reflected by the measurement target. The control part produces height data of the measurement target using grating pattern images of the measurement target, or produces height data of the measurement target using image positions of plane images for the measurement target and texture information of the measurement target. The control part employs a grating pattern illuminated on the measurement target as the texture information to produce height data of the measurement target. Thus, a three-dimensional shape may be measured more easily and accurately.
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