Invention Grant
- Patent Title: Multi-dimensional approach to imaging, monitoring, or measuring systems and processes utilizing capacitance sensors
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Application No.: US16449934Application Date: 2019-06-24
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Publication No.: US10746685B2Publication Date: 2020-08-18
- Inventor: Qussai Marashdeh , Benjamin Straiton , Christopher Zuccarelli
- Applicant: Tech4Imaging LLC
- Applicant Address: US OH Columbus
- Assignee: Tech4Imaging LLC
- Current Assignee: Tech4Imaging LLC
- Current Assignee Address: US OH Columbus
- Agency: Standley Law Group LLP
- Main IPC: G01N27/22
- IPC: G01N27/22 ; G01F1/64 ; G06T11/00 ; A61B5/05

Abstract:
A system and method for imaging, monitoring, or measuring systems and processes utilizing only data provided from capacitance sensors. The present invention combines the multi-frequency method of both ECVT/AECVT and DCPT to image or measure processes and systems more efficiently and accurately than the methods alone. The present system analyzes capacitance and current phase acquired at multiple frequencies to determine a plurality of properties of single and multiphase systems all at once. The combined use of ECVT and DCPT in multiphase flow can also be extended to measure volume fraction and phase distribution of flows involving greater than three phases by using multiple frequencies for capacitance, current phase, or both.
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