Invention Grant
- Patent Title: Testing system and adaptive method of generating test program
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Application No.: US16120864Application Date: 2018-09-04
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Publication No.: US10748636B2Publication Date: 2020-08-18
- Inventor: Chih-Chiang Lai
- Applicant: Winbond Electronics Corp.
- Applicant Address: TW Taichung
- Assignee: WINBOND ELECTRONICS CORP.
- Current Assignee: WINBOND ELECTRONICS CORP.
- Current Assignee Address: TW Taichung
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Main IPC: G11C29/36
- IPC: G11C29/36 ; G06N3/08 ; G11C29/44 ; G11C29/38

Abstract:
A testing system is provided. The testing system includes: test equipment and a testing-control apparatus. The test equipment is configured to perform tests on a device under test. The testing-control apparatus is configured to execute a test program to control the test equipment to perform a plurality of first test items in the test program on the device under test. The testing-control apparatus retrieves a test result of each of the first test items from the test equipment, and executes a test-program neural network to analyze the test result of each of the first test items to generate the test program for a next test iteration.
Public/Granted literature
- US20200075117A1 TESTING SYSTEM AND ADAPTIVE METHOD OF GENERATING TEST PROGRAM Public/Granted day:2020-03-05
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