Invention Grant
- Patent Title: X-ray analyzer and method for correcting counting rate
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Application No.: US16536562Application Date: 2019-08-09
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Publication No.: US10748741B2Publication Date: 2020-08-18
- Inventor: Kazunori Tsukamoto
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2339315b
- Main IPC: G01N23/22
- IPC: G01N23/22 ; H01J37/244 ; H01J37/252

Abstract:
An X-ray analyzer includes: an X-ray detector that detects an X-ray emitted from a specimen and outputs a signal having a step that has a height corresponding to energy of the X-ray; a pulse generation circuit that converts the signal output from the X-ray detector into a first pulse signal; a pulse-width setting circuit that sets a pulse width; a pulse-width conversion circuit that converts a pulse width of the first pulse signal into the pulse width set by the pulse-width setting circuit to form a second pulse signal; a pulse-height discriminator that discriminates the second pulse signal according to a pulse height of the second pulse signal; a counting circuit that calculates a counting rate of the discriminated second pulse signal; and a counting-loss correction processing unit that corrects the counting rate. The counting-loss correction processing unit corrects the counting rate based on the pulse width.
Public/Granted literature
- US20200058464A1 X-Ray Analyzer and Method for Correcting Counting Rate Public/Granted day:2020-02-20
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