Invention Grant
- Patent Title: Charged particle beam device and image processing method in charged particle beam device
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Application No.: US16673456Application Date: 2019-11-04
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Publication No.: US10763078B2Publication Date: 2020-09-01
- Inventor: Masato Kamio , Masashi Watanabe , Katsunori Hirano , Yoshinobu Hoshino , Shigeru Kawamata , Yuichi Sakurai
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee: HITACHI HIGH-TECH CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Volpe & Koenig, P.C.
- Main IPC: H01J37/22
- IPC: H01J37/22 ; H01J37/28 ; G06T5/00 ; H01J37/26

Abstract:
There is provided a charged particle beam device which includes a charged particle beam source, a charged particle beam optical system that irradiates a sample with a charged particle beam from the charged particle beam source, a detector that detects a secondary signal generated from the sample by irradiation with the charged particle beam, and an image processing unit that executes integration processing of image data obtained from the secondary signal and outputting an integrated image, and in which the image processing unit executes a normalization integration computation of outputting an integrated image in which a luminance value of the integrated image is always “1” in an integration process.
Public/Granted literature
- US20200066484A1 CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED PARTICLE BEAM DEVICE Public/Granted day:2020-02-27
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