Invention Grant
- Patent Title: Wafer processing method
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Application No.: US16533222Application Date: 2019-08-06
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Publication No.: US10784166B2Publication Date: 2020-09-22
- Inventor: Meiyu Piao , Kentaro Odanaka , Masatoshi Wakahara , Wakana Onoe , Heidi Lan
- Applicant: DISCO CORPORATION
- Applicant Address: JP Tokyo
- Assignee: DISCO CORPORATION
- Current Assignee: DISCO CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Greer Burns & Crain Ltd.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7b957479
- Main IPC: H01L21/78
- IPC: H01L21/78 ; H01L21/67 ; H01J37/32

Abstract:
A wafer processing method includes the following steps: forming, on a back side of a wafer including a device layer, a mask to be used in forming grooves in a substrate along streets from the back side of the wafer; applying plasma etching from the back side of the wafer through the mask to form the grooves in the substrate along the streets; ejecting high-pressure fluid against the back side of the wafer with the wafer mounted at its front side on a mounting surface to press the wafer at regions surrounded by the etched grooves; and bonding a tape to the front side of the wafer before performance of at least the pressing step.
Public/Granted literature
- US20200051861A1 WAFER PROCESSING METHOD Public/Granted day:2020-02-13
Information query
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