Invention Grant
- Patent Title: Spectroscope, wavelength measuring device, and spectrum measuring method
-
Application No.: US16316928Application Date: 2017-07-04
-
Publication No.: US10801893B2Publication Date: 2020-10-13
- Inventor: Tsuyoshi Konishi
- Applicant: OSAKA UNIVERSITY
- Applicant Address: JP Osaka
- Assignee: OSAKA UNIVERSITY
- Current Assignee: OSAKA UNIVERSITY
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@372b91d3
- International Application: PCT/JP2017/024479 WO 20170704
- International Announcement: WO2018/012351 WO 20180118
- Main IPC: G01J3/45
- IPC: G01J3/45 ; G01J9/02 ; G01J3/04 ; G01B11/25

Abstract:
A spectroscope for measuring a spectrum of input light includes a fringe former that forms first fringes having a first pitch by splitting the input light, a diffraction grating that disperses each of the first fringes, a moire pattern former that forms a moire pattern by overlaying the first fringes that have been dispersed, on second fringes having a second pitch different from the first pitch, and an image pickup device that measures the spectrum of the input light by detecting the moire pattern. At least one of the fringe former and the moire pattern former includes a cylindrical lens array.
Public/Granted literature
- US20190301938A1 SPECTROSCOPE, WAVELENGTH MEASURING DEVICE, AND SPECTRUM MEASURING METHOD Public/Granted day:2019-10-03
Information query