Invention Grant
- Patent Title: Q-factor detection method
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Application No.: US15998784Application Date: 2018-08-16
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Publication No.: US10804750B2Publication Date: 2020-10-13
- Inventor: Rui Liu , Zhitong Guo , Haiwen Jiang
- Applicant: Integrated Device Technology, Inc.
- Applicant Address: US CA San Jose
- Assignee: Integrated Device Technology, Inc.
- Current Assignee: Integrated Device Technology, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Haynes and Boone, LLP
- Main IPC: H02J50/60
- IPC: H02J50/60 ; H02J50/12 ; G01V3/38 ; G01R27/26 ; H02J7/02 ; G01V3/10

Abstract:
A method of measuring a Q-factor in a wireless power transmitter includes charging a capacitor in a LC tank circuit that includes a transmission coil to a voltage; starting a Q-factor determining by coupling the LC tank circuit to ground to form a free-oscillating circuit; monitoring the voltage across the capacitor as a function of time as the LC tank circuit oscillates; and determining the resonant frequency and the Q-factor from monitoring the voltage.
Public/Granted literature
- US20190140489A1 Q-factor detection method Public/Granted day:2019-05-09
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