Invention Grant
- Patent Title: System, apparatus and method for accurate measurement of off-chip temperature
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Application No.: US15861953Application Date: 2018-01-04
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Publication No.: US10823693B2Publication Date: 2020-11-03
- Inventor: Euisoo Yoo , Thomas Edward Voor , John M. Khoury
- Applicant: Silicon Laboratories Inc.
- Applicant Address: US TX Austin
- Assignee: Silicon Laboratories Inc.
- Current Assignee: Silicon Laboratories Inc.
- Current Assignee Address: US TX Austin
- Agency: Trop, Pruner & Hu, P.C.
- Main IPC: G01N27/18
- IPC: G01N27/18 ; H01Q1/00 ; H03L1/02 ; G01K13/00 ; G01K7/24

Abstract:
In an embodiment, an integrated circuit includes: a switched capacitor coupled between a supply voltage node and a divider node, where a thermistor external to the integrated circuit is to couple to the divider node; an analog-to-digital converter (ADC) coupled to the divider node to receive a voltage at the divider node and generate a digital value based thereon; and a controller coupled to the ADC to determine a temperature associated with the thermistor based at least in part on the digital value.
Public/Granted literature
- US20190204253A1 System, Apparatus And Method For Accurate Measurement Of Off-Chip Temperature Public/Granted day:2019-07-04
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