Invention Grant
- Patent Title: X-ray generator and x-ray analysis device
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Application No.: US16284777Application Date: 2019-02-25
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Publication No.: US10854348B2Publication Date: 2020-12-01
- Inventor: Kazuhiko Omote , Takeshi Osakabe , Tetsuya Ozawa , Licai Jiang , Boris Verman
- Applicant: Rigaku Corporation
- Applicant Address: JP Tokyo
- Assignee: RIGAKU CORPORATION
- Current Assignee: RIGAKU CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Cantor Colburn LLP
- Priority: JP2018-036208 20180301
- Main IPC: G21K1/00
- IPC: G21K1/00 ; G21K1/06 ; G01N23/201 ; G21K1/02 ; H05G1/02

Abstract:
An X-ray generator includes: a line X-ray source; a multilayer film mirror; and a side-by-side reflecting mirror including two concave mirrors joined together so as to share a join line. A cross section of a reflecting surface of the multilayer film mirror has a parabolic shape, and a focus of the parabolic shape is located at the line X-ray source. Cross sections of reflecting surfaces of the two concave mirrors of the side-by-side reflecting mirror each have a parabolic shape, and each of focuses of the parabolic shapes is located on a side opposite to the multilayer film mirror. An extended line of the join line of the side-by-side reflecting mirror passes through the multilayer film mirror and the line X-ray source as viewed in a plan view.
Public/Granted literature
- US20190272929A1 X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE Public/Granted day:2019-09-05
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