Invention Grant
- Patent Title: Method of forming a low-k layer and method of forming a semiconductor device
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Application No.: US16217339Application Date: 2018-12-12
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Publication No.: US10861695B2Publication Date: 2020-12-08
- Inventor: Sunyoung Lee , Minjae Kang , Se-Yeon Kim , Teawon Kim , Yong-Suk Tak , Sunjung Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2018-0048568 20180426
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/02 ; C23C16/36 ; C23C16/455 ; H01L21/28 ; H01L29/165 ; H01L29/49 ; H01L29/66

Abstract:
A method of forming a low-k layer includes forming a layer by providing a silicon source, a carbon source, an oxygen source, and a nitrogen source onto a substrate. The forming of the layer includes a plurality of main cycles, and each of the main cycles includes providing the silicon source, providing the carbon source, providing the oxygen source, and providing the nitrogen source, each of which is performed at least one time. Each of the main cycles includes sub-cycles in which the providing of the carbon source and the providing of the oxygen source are alternately performed.
Public/Granted literature
- US20190333754A1 Method of Forming a Low-K Layer and Method of Forming a Semiconductor Device Public/Granted day:2019-10-31
Information query
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