Invention Grant
- Patent Title: Fin field effect transistor devices with modified spacer and gate dielectric thicknesses
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Application No.: US16675890Application Date: 2019-11-06
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Publication No.: US10910372B2Publication Date: 2021-02-02
- Inventor: Xin Miao , Kangguo Cheng , Wenyu Xu , Chen Zhang
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Randall Bluestone
- Main IPC: H01L27/088
- IPC: H01L27/088 ; H01L29/66 ; H01L21/8234 ; H01L21/762 ; H01L29/78

Abstract:
A method of forming fin field effect devices is provided. The method includes forming a plurality of vertical fins on a substrate. The method further includes forming a dielectric pillar on the substrate between two adjacent vertical fins, wherein at least one of the vertical fins is on a first region of the substrate, and at least one of the vertical fins is on a second region of the substrate. The method further includes growing a bottom source/drain layer on the first region of the substrate and the second region of the substrate. The method further includes depositing a bottom spacer layer on the bottom source/drain layer, and a filler layer on the bottom spacer layer. The method further includes forming a cover block on the first region of the substrate, and removing the portion of the filler layer on the second region of the substrate.
Public/Granted literature
- US20200075589A1 FIN FIELD EFFECT TRANSISTOR DEVICES WITH MODIFIED SPACER AND GATE DIELECTRIC THICKNESSES Public/Granted day:2020-03-05
Information query
IPC分类: