Invention Grant
- Patent Title: Method and apparatus for direct write maskless lithography
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Application No.: US16064274Application Date: 2016-12-13
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Publication No.: US10928736B2Publication Date: 2021-02-23
- Inventor: Pieter Willem Herman De Jager , Coen Adrianus Verschuren , Erwin Paul Smakman , Erwin John Van Zwet , Wouter Frans Willem Mulckhuyse , Pieter Verhoeff , Robert Albertus Johannes Van Der Werf
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman, LLP
- International Application: PCT/EP2016/080809 WO 20161213
- International Announcement: WO2017/114653 WO 20170706
- Main IPC: G03F7/20
- IPC: G03F7/20 ; G03B27/42

Abstract:
An exposure apparatus including: a substrate holder constructed to support a substrate; a patterning device configured to provide radiation modulated according to a desired pattern, the patterning device including a plurality of two-dimensional arrays of radiation sources, each radiation source configured to emit a radiation beam; a projection system configured to project the modulated radiation onto the substrate, the projection system including a plurality of optical elements arranged side by side and arranged such that a two-dimensional array of radiation beams from a two-dimensional array of radiation sources impinges a single optical element of the plurality of optical elements; and an actuator configured to provide relative motion between the substrate and the plurality of two-dimensional arrays of radiation sources in a scanning direction to expose the substrate.
Public/Granted literature
- US20190011841A1 METHOD AND APPARATUS FOR DIRECT WRITE MASKLESS LITHOGRAPHY Public/Granted day:2019-01-10
Information query
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