- Patent Title: Methods for enhancing selectivity in SAM-based selective deposition
-
Application No.: US16193594Application Date: 2018-11-16
-
Publication No.: US10950433B2Publication Date: 2021-03-16
- Inventor: Chang Ke , Michael S. Jackson , Liqi Wu , Lei Zhou , Shuyi Zhang , David Thompson , Paul F. Ma , Biao Liu , Cheng Pan
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Servilla Whitney LLC
- Main IPC: H01L21/02
- IPC: H01L21/02 ; C23C16/02 ; C23C16/56 ; H01L21/3105 ; H01L21/32

Abstract:
Methods of improved selectively for SAM-based selective depositions are described. Some of the methods include forming a SAM on a second surface and a carbonized layer on the first surface. The substrate is exposed to an oxygenating agent to remove the carbonized layer from the first surface, and a film is deposited on the first surface over the protected second surface. Some of the methods include overdosing a SAM molecule to form a SAM layer and SAM agglomerates, depositing a film, removing the agglomerates, reforming the SAM layer and redepositing the film.
Public/Granted literature
- US20190157079A1 Methods for Enhancing Selectivity in SAM-Based Selective Deposition Public/Granted day:2019-05-23
Information query
IPC分类: