Invention Grant
- Patent Title: On-chip detection of spin states in color centers for metrology and information processing
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Application No.: US16260282Application Date: 2019-01-29
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Publication No.: US10962610B2Publication Date: 2021-03-30
- Inventor: Mohamed I Ibrahim , Christopher Foy , Donggyu Kim , Dirk Englund , Ruonan Han
- Applicant: Massachusetts Institute of Technology
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: Smith Baluch LLP
- Main IPC: G01R33/00
- IPC: G01R33/00 ; G01R33/032 ; G06N10/00 ; G11C13/06 ; G01R33/32 ; G01R33/24 ; G11C13/04 ; H01L23/528 ; H01L27/118 ; G02B5/20 ; H01L27/144

Abstract:
The Zeeman shift of electronic spins in nitrogen-vacancy (NV) centers in diamond has been exploited in lab-scale instruments for ultra-high-resolution, vector-based magnetic sensing. A quantum magnetometer in CMOS utilizing a diamond-nanocrystal layer with NVs or NV-doped bulk diamond on a chip-integrated system provides vector-based magnetic sensing in a compact package. The system performs two functions for the quantum magnetometry: (1) strong generation and efficient delivery of microwave for quantum-state control and (2) optical filtering/detection of spin-dependent fluorescence for quantum-state readout. The microwave delivery can be accomplished with a loop inductor or array of wires integrated into the chip below the nanodiamond layer or diamond. And the wire array can also suppress excitation light using a combination of plasmonic and (optionally) Talbot effects.
Public/Granted literature
- US20190235031A1 On-Chip Detection of Spin States in Color Centers for Metrology and Information Processing Public/Granted day:2019-08-01
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