An integrated circuit comprising: a high-side pMOSFET comprising a drain and a gate; a node coupled to the drain of the high-side pMOSFET; a voltage-to-current circuit comprising a first nMOSFET and a first resistor, the first nMOSFET comprising a gate and a source, the first resistor comprising a terminal coupled to the source of the first nMOSFET; an error amplifier comprising an output port coupled to the gate of the first nMOSFET; a skip clamp nMOSFET comprising a source coupled to the output port of the error amplifier; and a current limit clamp pMOSFET comprising a source coupled to the output port of the error amplifier.