Invention Grant
- Patent Title: Measurement system, measurement method, and pressure measurement apparatus
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Application No.: US16410201Application Date: 2019-05-13
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Publication No.: US11022512B2Publication Date: 2021-06-01
- Inventor: Hirokazu Nagashima , Tadahiko Iinuma , Hironori Kurihara , Hideki Yamada
- Applicant: YOKOGAWA ELECTRIC CORPORATION , Yokogawa Test & Measurement Corporation
- Applicant Address: JP Musashino; JP Musashino
- Assignee: YOKOGAWA ELECTRIC CORPORATION,Yokogawa Test & Measurement Corporation
- Current Assignee: YOKOGAWA ELECTRIC CORPORATION,Yokogawa Test & Measurement Corporation
- Current Assignee Address: JP Musashino; JP Musashino
- Agency: Kenja IP Law PC
- Priority: JPJP2018-093291 20180514
- Main IPC: G01L19/08
- IPC: G01L19/08
Abstract:
A measurement system (20) includes pressure measurement apparatuses (220, 221, 222) capable of measuring pressure. The pressure measurement apparatuses (220, 221, 222) measure pressure at a measurement timing designated by a trigger signal.
Information query
