Invention Grant
- Patent Title: High-density low temperature carbon films for hardmask and other patterning applications
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Application No.: US15979842Application Date: 2018-05-15
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Publication No.: US11043372B2Publication Date: 2021-06-22
- Inventor: Eswaranand Venkatasubramanian , Samuel E. Gottheim , Yang Yang , Pramit Manna , Kartik Ramaswamy , Takehito Koshizawa , Abhijit Basu Mallick , Srinivas Gandikota
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan, LLP
- Main IPC: H01L21/683
- IPC: H01L21/683 ; H01L21/033 ; H01L21/02 ; H01L21/311 ; H01J37/32 ; C23C16/27 ; C23C16/505 ; C23C16/56 ; G03F7/20 ; H01L21/67 ; C23C16/458 ; C23C16/26 ; H01L27/11551 ; H01L27/11578 ; H01L27/11582 ; H01L27/11556

Abstract:
Implementations of the present disclosure generally relate to the fabrication of integrated circuits. More particularly, the implementations described herein provide techniques for deposition of high-density films for patterning applications. In one implementation, a method of processing a substrate is provided. The method includes flowing a hydrocarbon-containing gas mixture into a processing volume of a process chamber having a substrate positioned on an electrostatic chuck. The substrate is maintained at a pressure between about 0.5 mTorr and about 10 Torr. The method further includes generating a plasma at the substrate level by applying a first RF bias to the electrostatic chuck to deposit a diamond-like carbon film on the substrate. The diamond-like carbon film has a density greater than 1.8 g/cc and a stress less than −500 MPa.
Public/Granted literature
- US20180358222A1 HIGH-DENSITY LOW TEMPERATURE CARBON FILMS FOR HARDMASK AND OTHER PATTERNING APPLICATIONS Public/Granted day:2018-12-13
Information query
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