- Patent Title: Gallium nitride (GaN) based transistor with multiple p-GaN blocks
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Application No.: US16294687Application Date: 2019-03-06
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Publication No.: US11049960B2Publication Date: 2021-06-29
- Inventor: Chang Soo Suh , Sameer Prakash Pendharkar , Naveen Tipirneni , Jungwoo Joh
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Jacqueline J. Garner; Charles A. Brill; Frank D. Cimino
- Main IPC: H01L29/872
- IPC: H01L29/872 ; H01L29/205 ; H01L29/778 ; H01L29/66 ; H01L29/20 ; H01L29/423 ; H01L21/308 ; H01L29/417 ; H01L21/02

Abstract:
In some examples, a gallium nitride (GaN)-based transistor, comprises a substrate; a GaN layer supported by the substrate; an aluminum nitride gallium (AlGaN) layer supported by the GaN layer; a p-doped GaN structure supported by the AlGaN layer; and multiple p-doped GaN blocks supported by the AlGaN layer, each of the multiple p-doped GaN blocks physically separated from the remaining multiple p-doped GaN blocks, wherein first and second contours of a two-dimensional electron gas (2DEG) of the GaN-based transistor are at an interface of the AlGaN and GaN layers.
Public/Granted literature
- US20200287033A1 GALLIUM NITRIDE (GaN) BASED TRANSISTOR WITH MULTIPLE p-GaN BLOCKS Public/Granted day:2020-09-10
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