- Patent Title: Microfabricated ion trap chip with in situ radio-frequency sensing
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Application No.: US16821150Application Date: 2020-03-17
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Publication No.: US11056332B1Publication Date: 2021-07-06
- Inventor: Peter Lukas Wilhelm Maunz , Matthew G. Blain , Christopher Nordquist
- Applicant: National Technology & Engineering Solutions of Sandia, LLC
- Applicant Address: US NM Albuquerque
- Assignee: National Technology & Engineering Solutions of Sandia, LLC
- Current Assignee: National Technology & Engineering Solutions of Sandia, LLC
- Current Assignee Address: US NM Albuquerque
- Agent Martin I. Finston
- Main IPC: H01J49/42
- IPC: H01J49/42 ; G06N10/00 ; H01J49/00 ; B82Y10/00
Abstract:
A radio-frequency (RF) surface ion trap chip includes an RF electrode and an integrated capacitive voltage divider in which an intermediate voltage node is capacitively connected between the RF electrode and a ground. A sensor output trace is connected to the intermediate voltage node.
Public/Granted literature
- US2741935A Saw set Public/Granted day:1956-04-17
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