Invention Grant
- Patent Title: Evaluator, measurement apparatus, evaluating method, and non-transitory recording medium
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Application No.: US16502290Application Date: 2019-07-03
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Publication No.: US11060918B2Publication Date: 2021-07-13
- Inventor: Takuroh Sone , Takafumi Hiroi , Takashi Soma , Shuhei Watanabe , Hideyuki Kihara
- Applicant: Takuroh Sone , Takafumi Hiroi , Takashi Soma , Shuhei Watanabe , Hideyuki Kihara
- Applicant Address: JP Kanagawa; JP Tokyo; JP Kanagawa; JP Chiba; JP Kanagawa
- Assignee: Takuroh Sone,Takafumi Hiroi,Takashi Soma,Shuhei Watanabe,Hideyuki Kihara
- Current Assignee: Takuroh Sone,Takafumi Hiroi,Takashi Soma,Shuhei Watanabe,Hideyuki Kihara
- Current Assignee Address: JP Kanagawa; JP Tokyo; JP Kanagawa; JP Chiba; JP Kanagawa
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPJP2018-133476 20180713
- Main IPC: G01J3/50
- IPC: G01J3/50 ; G06T7/136 ; G06T7/11 ; G01J3/02 ; G01J3/42 ; G01N21/57 ; G06T7/00
Abstract:
An evaluating method includes obtaining, by an imaging device, a two-dimensional reflected light amount distribution of a surface of a target; classifying, by one or more processors, the surface into a plurality of areas on the basis of chromaticity information of the two-dimensional reflected light amount distribution; and evaluating, by one or more processors, appearance characteristics of the target on the basis of respective sets of chromaticity information of the areas.
Public/Granted literature
- US20200018650A1 EVALUATOR, MEASUREMENT APPARATUS, EVALUATING METHOD, AND NON-TRANSITORY RECORDING MEDIUM Public/Granted day:2020-01-16
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