Invention Grant
- Patent Title: Method of generating elemental map and surface analyzer
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Application No.: US16590706Application Date: 2019-10-02
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Publication No.: US11062434B2Publication Date: 2021-07-13
- Inventor: Tatsuya Uchida
- Applicant: JEOL Ltd.
- Applicant Address: JP Tokyo
- Assignee: JEOL Ltd.
- Current Assignee: JEOL Ltd.
- Current Assignee Address: JP Tokyo
- Agency: The Webb Law Firm
- Priority: JPJP2018-189983 20181005
- Main IPC: G06T5/00
- IPC: G06T5/00 ; G01N23/2273 ; G01N23/2276 ; G06T5/50 ; G06T7/40

Abstract:
A method of generating an elemental map includes: acquiring a plurality of correction channel images by scanning a surface of a standard specimen having a uniform elemental concentration with a primary beam and generating a correction channel image for each channel; generating correction information for each pixel of each correction channel image among the plurality of correction channel images based on a brightness value of the pixel; acquiring a plurality of analysis channel images by scanning a surface of a specimen to be analyzed with the primary beam and generating an analysis channel image for each channel; correcting brightness values of pixels constituting an analysis channel image among the plurality of analysis channel images based on the correction information; and generating an elemental map of the specimen to be analyzed based on the plurality of analysis channel images having pixels with corrected brightness values.
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