Invention Grant
- Patent Title: Measurement system and method for measuring a response time of a liquid crystal display
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Application No.: US17113117Application Date: 2020-12-07
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Publication No.: US11100828B2Publication Date: 2021-08-24
- Inventor: Yung-Chih Chen , Wei-Chih Lin , Jui-Te Wei , Po-An Chen
- Applicant: Realtek Semiconductor Corp.
- Applicant Address: TW HsinChu
- Assignee: Realtek Semiconductor Corp.
- Current Assignee: Realtek Semiconductor Corp.
- Current Assignee Address: TW HsinChu
- Agent Winston Hsu
- Priority: TW108145293 20191211
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G09G3/36 ; G01J1/44 ; G01J1/42

Abstract:
A measurement system has a photosensitive element, an analog-to-digital converter (ADC), a reference voltage source, and a transmission interface. The photosensitive element senses variations of brightness of a display panel of a liquid crystal display (LCD) to generate a voltage signal. The ADC converts the voltage signal into a digital signal. The reference voltage source provides a reference voltage to the ADC to drive the ADC to dynamically adjust a convertible voltage range of the ADC for any voltage inputted to the ADC according to the reference voltage. The transmission interface transmits the digital signal to a computer to trigger the computer to calculate a response time of the LCD according to the digital signal.
Public/Granted literature
- US20210183284A1 Measurement system and method for measuring a response time of a liquid crystal display Public/Granted day:2021-06-17
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