Invention Grant
- Patent Title: Measurement circuit and method therefor
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Application No.: US16410320Application Date: 2019-05-13
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Publication No.: US11112303B2Publication Date: 2021-09-07
- Inventor: Dieter Jozef Joos , Thomas Sevrin , Patrick Lepers
- Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Applicant Address: US AZ Phoenix
- Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
- Current Assignee Address: US AZ Phoenix
- Agent Robert F. Hightower
- Main IPC: G01J1/44
- IPC: G01J1/44 ; H03F3/45
Abstract:
In embodiment, a measurement circuit forms a compensation signal that is representative of disturbances that are received while the measurement circuit is not receiving a signal to be measured, then the circuit removes the compensation signal from the measurement signal before measuring the value of the measurement signal.
Public/Granted literature
- US20200264040A1 SEMICONDUCTOR DEVICE AND METHOD THEREFOR Public/Granted day:2020-08-20
Information query
