Invention Grant
- Patent Title: Method and system for pattern configuration
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Application No.: US16349317Application Date: 2017-11-13
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Publication No.: US11176307B2Publication Date: 2021-11-16
- Inventor: Venugopal Vellanki , Been-Der Chen
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- International Application: PCT/EP2017/079033 WO 20171113
- International Announcement: WO2018/099716 WO 20180607
- Main IPC: G06F30/398
- IPC: G06F30/398 ; G06F30/392 ; G03F1/36 ; G03F7/20

Abstract:
A method including: obtaining a device design pattern layout having a plurality of design pattern polygons; automatically identifying, by a computer, a unit cell of polygons in the device design pattern layout; identifying a plurality of occurrences of the unit cell within the device design pattern layout to build a hierarchy; and performing, by the computer, an optical proximity correction on the device design pattern layout by repeatedly applying an optical proximity correction designed for the unit cell to the occurrences of the unit cell in the hierarchy.
Information query