An apparatus for generating structured illumination images, comprising a housing; imaging optics mounted within the housing, the imaging optics configured to focus illumination from an illumination source such that an in-focus pattern of light corresponding to a pattern on a photomask is projected onto a sample; a reflector mounted within the housing and configured to reflect the illumination to a sample; a filter apparatus, comprising one or more filters mounted within the housing, the filter apparatus configured to allow only emissions from the illuminated sample to pass through to the sensor; and mounting features on the housing, the mounting features configured to allow the apparatus to be installed within an imaging system.