Invention Grant
- Patent Title: Optical measurement device, optical measurement method, and scanning microscope
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Application No.: US16819406Application Date: 2020-03-16
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Publication No.: US11237047B2Publication Date: 2022-02-01
- Inventor: Kentaro Imoto , Makoto Ishikake
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Priority: WOPCT/JP2017/033816 20170920
- Main IPC: G01J1/44
- IPC: G01J1/44 ; G01T1/24 ; G01J1/04 ; G01N21/27 ; G01T1/29

Abstract:
An optical measurement device includes: an optical sensor that detects pulsed signal light and that outputs a detection signal formed of an exponential-function response; an A/D converter that samples the detection signal output from the optical sensor and that converts the detection signal into a digital signal; and a processor comprising hardware, the processor being configured to subject the digital signal output from the A/D converter to inverse transformation by using a multiple diagonal matrix, thus calculating an estimated pulse of the signal light.
Public/Granted literature
- US20200217716A1 OPTICAL MEASUREMENT DEVICE, OPTICAL MEASUREMENT METHOD, AND SCANNING MICROSCOPE Public/Granted day:2020-07-09
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