Invention Grant
- Patent Title: Test information management device, test information management method, and non-transitory computer readable storage medium
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Application No.: US16429318Application Date: 2019-06-03
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Publication No.: US11237932B2Publication Date: 2022-02-01
- Inventor: Ryouhei Furihata , Yusuke Yokota
- Applicant: YOKOGAWA ELECTRIC CORPORATION
- Applicant Address: JP Musashino
- Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee Address: JP Musashino
- Agency: Sughrue Mion, PLLC
- Priority: JPJP2018-113629 20180614
- Main IPC: G06F11/273
- IPC: G06F11/273 ; G06F11/263 ; G06F11/277 ; G05B23/02 ; G01R31/00 ; G01R31/28

Abstract:
A test information management device manages test information relating to a test carried out by receiving a test signal output from a first device in a second device. The test information management device includes a linker configured to link together first information including information representing an output state of the test signal in the first device and second information including image information representing reception results of the test signal in the second device using at least one of identification information for identifying the first device or the second device and times at which the first information and the second information are generated.
Public/Granted literature
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