Invention Grant
- Patent Title: Commanded JTAG test access port operations
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Application No.: US16824333Application Date: 2020-03-19
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Publication No.: US11269008B2Publication Date: 2022-03-08
- Inventor: Lee D. Whetsel
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Charles F. Koch; Charles A. Brill; Frank D. Cimino
- Main IPC: G06F11/273
- IPC: G06F11/273 ; G01R31/3177 ; G01R31/3185 ; G06F11/34 ; G06F9/30

Abstract:
The disclosure describes a novel method and apparatus for improving the operation of a TAP architecture in a device through the use of Command signal inputs to the TAP architecture. In response to a Command signal input, the TAP architecture can perform streamlined and uninterrupted Update, Capture and Shift operation cycles to a target circuit in the device or streamlined and uninterrupted capture and shift operation cycles to a target circuit in the device. The Command signals can be input to the TAP architecture via the devices dedicated TMS or TDI inputs or via a separate CMD input to the device.
Public/Granted literature
- US20200217888A1 COMMANDED JTAG TEST ACCESS PORT OPERATIONS Public/Granted day:2020-07-09
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