Invention Grant
- Patent Title: Computer aided inspection system and methods
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Application No.: US16412067Application Date: 2019-05-14
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Publication No.: US11270426B2Publication Date: 2022-03-08
- Inventor: Garbis Salgian , Bogdan C. Matei , Taragay Oskiper , Mikhail Sizintsev , Rakesh Kumar , Supun Samarasekera
- Applicant: SRI International
- Applicant Address: US CA Menlo Park
- Assignee: SRI International
- Current Assignee: SRI International
- Current Assignee Address: US CA Menlo Park
- Agency: Moser Taboada
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G02B27/01 ; G01B11/02

Abstract:
Computer aided inspection systems (CAIS) and method for inspection, error analysis and comparison of structures are presented herein. In some embodiments, a CAIS may include a SLAM system configured to determine real-world global localization information of a user in relation to a structure being inspected using information obtained from a first sensor package, a model alignment system configured to: use the determined global localization information to index into a corresponding location in a 3D computer model of the structure being inspected; and align observations and/or information obtained from the first sensor package to the local area of the model 3D computer model of the structure extracted; a second sensor package configured to obtain fine level measurements of the structure; and a model recognition system configured to compare the fine level measurements and information obtained about the structure from the second sensor package to the 3D computer model.
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