Invention Grant
- Patent Title: Method and system for terahertz radiation detection and characterization
-
Application No.: US16317898Application Date: 2017-07-14
-
Publication No.: US11274969B2Publication Date: 2022-03-15
- Inventor: Tsuneyuki Ozaki , Xin Chai
- Applicant: INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Applicant Address: CA Quebec
- Assignee: INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Current Assignee: INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Current Assignee Address: CA Quebec
- Agency: Lavery, De Billy, LLP
- Agent Gwendoline Bruneau
- International Application: PCT/CA2017/050852 WO 20170714
- International Announcement: WO2018/014118 WO 20180125
- Main IPC: G01J4/04
- IPC: G01J4/04 ; G01J9/00

Abstract:
A characterization and detection method and system, the system comprising a terahertz beam source, a probe beam source, a detection crystal receiving a probe beam from the probe beam source and a terahertz beam from the terahertz beam source, the probe beam and the terahertz beam co-propagating collinearly through the detection crystal, and a polarizer analyser receiving the pump beam transmitted from the detection crystal, wherein the polarizer analyser comprises two liquid crystal variable retarders and a linear polarizer, the polarizer analyzer analyzing a phase delay and orientation changes of the principle axes of the probe beam induced by the THz electric field and polarization.
Public/Granted literature
- US20210325250A1 METHOD AND SYSTEM FOR TERAHERTZ RADIATION DETECTION AND CHARACTERIZATION Public/Granted day:2021-10-21
Information query