Invention Grant
- Patent Title: Industrial image inspection method and system and computer readable recording medium
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Application No.: US16217904Application Date: 2018-12-12
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Publication No.: US11315231B2Publication Date: 2022-04-26
- Inventor: Yu-Ting Lai , Jwu-Sheng Hu , Ya-Hui Tsai , Keng-Hao Chang
- Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Applicant Address: TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: TW107134854 20181002
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06K9/62

Abstract:
An industrial image inspection method includes: generating a test latent vector of a test image; measuring a distance between a training latent vector of a normal image and the test latent vector of the test image; and judging whether the test image is normal or defected according to the distance between the training latent vector of the normal image and the test latent vector of the test image.
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