Invention Grant
- Patent Title: Estimating a parameter of a substrate
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Application No.: US17055215Application Date: 2019-04-02
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Publication No.: US11327406B2Publication Date: 2022-05-10
- Inventor: Svetla Petrova Matova , Jochem Sebastiaan Wildenberg , Roy Werkman , Luc Roumen
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Priority: EP18172621 20180516
- International Application: PCT/EP2019/058231 WO 20190402
- International Announcement: WO2019/219285 WO 20191121
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
A method for estimating a parameter across a region on a substrate, the region being divided into a plurality of sub-regions, the method including: obtaining values of the parameter for at least two sub-regions out of the plurality of sub-regions; and estimating the parameter for a position on the region by evaluation of a function having said values of the parameter as input values, wherein the function: a) has piecewise defined base functions, wherein a single base function is defined across a sub-region; and b) is continuous between one or more adjacent sub-regions of the at least two sub-regions within the region.
Public/Granted literature
- US20210271171A1 ESTIMATING A PARAMETER OF A SUBSTRATE Public/Granted day:2021-09-02
Information query
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