Invention Grant
- Patent Title: Apparatus for and method of in-situ particle removal in a lithography apparatus
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Application No.: US16967794Application Date: 2019-02-04
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Publication No.: US11333984B2Publication Date: 2022-05-17
- Inventor: Richard Joseph Bruls , Ronald Peter Albright , Peter Conrad Kochersperger , Victor Antonio Perez-Falcon
- Applicant: ASML Netherlands B.V. , ASML Holding N.V.
- Applicant Address: NL Veldhoven; NL Veldhoven
- Assignee: ASML Netherlands B.V.,ASML Holding N.V.
- Current Assignee: ASML Netherlands B.V.,ASML Holding N.V.
- Current Assignee Address: NL Veldhoven; NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- International Application: PCT/EP2019/052581 WO 20190204
- International Announcement: WO2019/158380 WO 20190822
- Main IPC: G03F7/20
- IPC: G03F7/20 ; B08B6/00

Abstract:
Methods and systems are described for reducing particles in the vicinity of an electrostatic chuck (300) in which a cleaning reticle or substrate (320) is secured to the chuck, the cleaning reticle or substrate having surfaces partially devoid of conductive material so that an electric field from the chuck can pass through to a volume adjacent the substrate to draw particles (360) in the volume to the surface of the substrate. Voltage supplied to the chuck may have an alternating polarity to enhance the attraction of particles to the surface.
Public/Granted literature
- US20210041795A1 Apparatus For and Method of In-Situ Particle Removal in a Lithography Apparatus Public/Granted day:2021-02-11
Information query
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