Invention Grant
- Patent Title: Work function based approaches to transistor threshold voltage tuning
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Application No.: US16016411Application Date: 2018-06-22
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Publication No.: US11335800B2Publication Date: 2022-05-17
- Inventor: Han Wui Then , Marko Radosavljevic , Sansaptak Dasgupta , Paul Fischer , Walid Hafez
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: H01L29/20
- IPC: H01L29/20 ; H01L29/778 ; H01L29/205 ; H01L21/02 ; H01L29/66 ; H01L29/08 ; H01L29/423 ; H01L29/49 ; H01L27/088 ; H01L21/8252

Abstract:
A semiconductor device is disclosed. The semiconductor device includes a substrate, an epitaxial layer on the substrate, a semiconductor interlayer on top of the epitaxial layer, a gate conductor above the semiconductor interlayer, a gate insulator on the bottom and sides of the gate conductor and contacting the top surface of the semiconductor interlayer, a source region extending into the epitaxial layer, and a drain region extending into the epitaxial layer. The semiconductor device also includes a first polarization layer on the semiconductor interlayer between the source region and the gate conductor and a second polarization layer on the semiconductor interlayer between the drain region and the gate conductor.
Public/Granted literature
- US20190393332A1 WORK FUNCTION BASED APPROACHES TO TRANSISTOR THRESHOLD VOLTAGE TUNING Public/Granted day:2019-12-26
Information query
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