Invention Grant
- Patent Title: Method for producing yttrium oxide-containing thin film by atomic layer deposition
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Application No.: US16494838Application Date: 2018-02-13
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Publication No.: US11335896B2Publication Date: 2022-05-17
- Inventor: Akihiro Nishida , Atsushi Yamashita
- Applicant: ADEKA CORPORATION
- Applicant Address: JP Tokyo
- Assignee: ADEKA CORPORATION
- Current Assignee: ADEKA CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JPJP2017-064631 20170329
- International Application: PCT/JP2018/004849 WO 20180213
- International Announcement: WO2018/179924 WO 20181004
- Main IPC: H01M4/04
- IPC: H01M4/04 ; C23C16/455

Abstract:
A method for producing an yttrium oxide-containing thin film by atomic layer deposition, the method comprising: a step for introducing a raw material gas containing tris(sec-butylcyclopentadienyl) yttrium into a treatment atmosphere in order to deposit tris(sec-butylcyclopentadienyl) yttrium on a substrate; and a step for introducing a reactive gas containing water vapor into the treatment atmosphere and causing the reactive gas to react with the tris(sec-butylcyclopentadienyl) yttrium that has been deposited on the substrate, thereby oxidizing yttrium is provided.
Public/Granted literature
- US20200083520A1 METHOD FOR PRODUCING YTTRIUM OXIDE-CONTAINING THIN FILM BY ATOMIC LAYER DEPOSITION Public/Granted day:2020-03-12
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