Invention Grant
- Patent Title: Spectrum measurement system
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Application No.: US16879777Application Date: 2020-05-21
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Publication No.: US11340114B2Publication Date: 2022-05-24
- Inventor: Chun-Ta Huang , Wei-Hsin Wang , Chien-Chung Chang
- Applicant: PROTRUSTECH CO., LTD
- Applicant Address: TW Tainan
- Assignee: PROTRUSTECH CO., LTD
- Current Assignee: PROTRUSTECH CO., LTD
- Current Assignee Address: TW Tainan
- Agency: JCIPRNET
- Priority: TW108117712 20190522
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01J3/02 ; G01N21/65

Abstract:
A spectrum measurement system includes a laser light source system, an optical signal receiving system and a beam splitting system. The laser light source system is configured to emit a laser output light beam to the object. The laser output light beam includes at least one of a first and a second peak-wavelength laser. After the object is radiated by the laser output light beam, the object generates a conversion beam. The conversion beam includes at least one of a first and a second spectral signals. The optical signal receiving system includes at least a first and a second signal receivers being respectively configured to receive the first and the second spectral signals. The beam splitting system provides a plurality of light exiting paths being configured to respectively transmit the first and the second spectral signals to the first and the second signal receivers.
Public/Granted literature
- US20200370962A1 SPECTRUM MEASUREMENT SYSTEM Public/Granted day:2020-11-26
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