- Patent Title: Measurement device, calibration curve generation system, spectrum measurement method, calibration curve generation method, analysis device, liquefied gas production plant, and property analysis method
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Application No.: US16720426Application Date: 2019-12-19
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Publication No.: US11340159B2Publication Date: 2022-05-24
- Inventor: Ryota Sakai , Hideko Tanaka , Youko Nozawa , Toshiki Ohara
- Applicant: YOKOGAWA ELECTRIC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Rankin, Hill & Clark LLP
- Priority: JPJP2018-247804 20181228
- Main IPC: G01N21/359
- IPC: G01N21/359 ; G01N21/27 ; G01N21/3504
Abstract:
A measurement device includes: a container into which sample gas is to be injected; a liquefaction mechanism configured to liquefy the sample gas in the container; a near-infrared probe extending from inside to outside the container; and a near-infrared measuring instrument configured to measure an absorbance spectrum of the sample gas in a state of being liquefied by the liquefaction mechanism, via the near-infrared probe.
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