Invention Grant
- Patent Title: Stimulated Raman scattering microscope device and stimulated Raman scattering measurement method
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Application No.: US16076389Application Date: 2017-02-09
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Publication No.: US11340171B2Publication Date: 2022-05-24
- Inventor: Yasuyuki Ozeki , Yuta Suzuki , Yoshifumi Wakisaka , Keisuke Goda
- Applicant: THE UNIVERSITY OF TOKYO
- Applicant Address: JP Tokyo
- Assignee: THE UNIVERSITY OF TOKYO
- Current Assignee: THE UNIVERSITY OF TOKYO
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JPJP2016-022615 20160209
- International Application: PCT/JP2017/004728 WO 20170209
- International Announcement: WO2017/138606 WO 20170817
- Main IPC: G01N21/65
- IPC: G01N21/65 ; G01J3/02 ; G01J3/10 ; G01J3/28 ; G01J3/44 ; G02B21/06 ; G01N21/85

Abstract:
A stimulated Raman scattering microscope device is configured to irradiates a sample with a first optical pulse at a first repetition frequency, to irradiate the sample with a second optical pulse of an optical frequency different from an optical frequency of the first optical pulse at a second repetition frequency, and to detect optical pulses of the first repetition frequency that are included in detected light from the sample irradiated with the first optical pulse and the second optical pulse, as a detected optical pulse train. The second optical pulse is generated by dispersing predetermined optical pulses that include lights of a plurality of optical frequencies, regulating to output optical pulses of a predetermined number of different optical frequencies out of the dispersed optical pulses at the second repetition frequency, and coupling the regulated optical pulses.
Public/Granted literature
- US20190137401A1 STIMULATED RAMAN SCATTERING MICROSCOPE DEVICE AND STIMULATED RAMAN SCATTERING MEASUREMENT METHOD Public/Granted day:2019-05-09
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